ZEISS AxioExaminer microscope – Configuration 1

The Axio Examiner.A1 Configuration 1 from ZEISS is designed for patch clamp experiments and other applications requiring optimal access to the sample. The microscope maximises the space around the preparation by shifting the optical axis to the front of the objective turret and replacing the objectives by lifting and rotating them backwards, thus avoiding interference with the micro-pipettes.

The stage and condenser can be adjusted independently, providing a working height of over 100 mm. The main adjustments – focus, stage height, condenser diaphragm, dia- and episcopic illumination, light intensity and Dodt gradient contrast – are accessible from the front of the microscope.

The optical system has been specifically developed for electrophysiology and allows several observation techniques to be combined on the same instrument: single oblique observation and Dodt gradient contrast. Simple oblique observation is integrated into the condenser with 360° rotation of the diaphragm, while Dodt gradient contrast offers a cost-effective alternative for observing thick preparations, with a pull-pull polariser (visible light/IR positions) and ‘Push & Click’ analyser.

Two long-distance condensers are available, with numerical apertures of 0.8 and 0.9, for great optical flexibility depending on the application.